A Zeiss Crossbeam 550L focused ion beam - scanning electron microscope (FIB-SEM) has been ordered by the WVU SRF. The brand new system will be housed in the Electron Microscopy Facilities at the Engineering Science Building. The order follows a thorough evaluation process by a technical committee composed of representative faculty and researchers at WVU. Various candidate systems from renowned manufacturers were evaluated and the Zeiss system was determined to be the most suitable. Given manufacturing lead times and special site requirements, the new FIB-SEM is expected to be available to researchers by Summer 2025. It will find widespread applications in metallurgy, ceramics, composites, polymers, geology, arts, biology, pharmaceuticals, forensics, and other disciplines.
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