The Shared Research Facilities (SRF) is exploring options to upgrade Scanning Electron Microscopy capabilities within the Electron Microscopy Facilities (EMF). A request for federal funding (CDS) was recently submitted for FY 2023. In the meantime, an initial survey of current and potential users identified the following desired capabilities in the new system:
- A focused ion beam – preferably a plasma focused ion beam
- A laser beam for ablation
- Ability to handle biological samples
- Ability to apply temperature, electrical and mechanical stimuli for in-situ imaging/characterization
- EDS and EBSD analyses
To help decide on the best combination to address current and future research needs, the SRF will be hosting different manufacturers to present their products and capabilities over the next few weeks. The presentations will be in-person and will also be accessible via the web. Recordings could be made be available on request for later viewing. The tentative dates and times of the presentations are as follows:
|
Manufacturer |
Date |
Time |
Venue |
Details |
|
TESCAN |
May 6 |
9 a.m. - 12 p.m. |
WH G51 |
|
|
ZEISS |
May 12 |
2 p.m. - 5 p.m. |
WH 105 |
|
|
Hitachi |
May 16 |
12 p.m. – 2:30 p.m. |
Web Only |
|
|
ThermoFisher Scientific |
May 25 |
1 p.m.– 4 p.m. |