X-Ray Diffractometry Chemical Optical Probe Microscopy
X-Ray Diffractometry
PANalytical X’Pert Pro XRD
- Identification of single-phase materials and multi-phase mixture
- Quantitative determination of amounts of different phases in multi-phase mixture
- Cu-kα1 8047.2 eV source
- Maximum X-Ray power of 45 kV and 40 mA
- Angular range of 0° < 2θ < 110°
- Highscore Plus analysis software with PDF 3 database
- Spinning sample stage/Universal sample stage/Clip-on sample stage
- Automatic sample loader for up to 45 samples
- Powders, pellets, thin films or bulk materials
Location: 211 Engineering Research Building
Bruker D8 Discovery XRD
- For determining the crystal structure of solids, powders and thin films
- Reciprocal space mapping of crystalline materials and 2D mapping of wafers
- Cu-kα1 8047.2 eV source
- Maximum X-Ray power of 50 kV and 50 mA and 1 mm slit size
- 360° angular range with a maximum user range of -100° < 2θ < 169°
- Leptos analysis software
- 1 inch hot stage from ambient to 900 °C
- 1 inch sample clip stage
- 5 inch vacuum stage
- Powders, thin films or bulk materials
Location: 211 Engineering Research Building
Chemical
X-ray Photoelectron Spectroscopy/Ultraviolet Photoelectron Spectroscopy (XPS/UPS)
Physical Electronics PHI 5000 VersaProbe XPS/UPS
- For micro-area element composition and chemical state determination at material surface
- Depth profile analysis of structures and interfaces
- Al, Mg and focused Al X-ray sources and He UV source
- Spectral range of 0 to 1400 eV binding energy
- Energy resolution of 0.50 eV
- Sample of any size up to 50 mm in diameter
- Powders and thin films
Location: B62 Engineering Sciences Building
Fourier Transform Infra-Red (FTIR) Spectrometer
Digilab FTS 7000 FTIR System
- For analyzing chemical composition of micro/macro samples and qualitatively identify molecules and functional groups
- Mid-IR to near-IR source spectrum of 25,000 to 50 cm-1 wavenumbers
- Detection range: 10,000 to 150 cm-1 wavenumbers
- Variable angle, Ge ATR, Diamond ATR and photo-acoustic bench accessories
- UMA 600 infrared microscope with MCT and Stingray MCT array detectors
Location: 211 Engineering Research Building
Raman Spectroscopy
Renishaw InVia Raman Microscope
- To determine chemical composition, molecular structure and molecular interactions and quantitative analysis of material chemical compositions
- Less than 1 micrometer lateral spatial resolution
- 409 nm, 532 nm and 785 nm excitation wavelengths at 100 mW maximum power
- Maximum Sample Size of 9 mm × 15 mm × 8 mm thick
Location: 381D Chemistry Research Laboratory Building
Optical
Ellipsometry
J.A. Woollam M-2000U Ellipsometer
- For characterizing film thickness with Angstrom accuracy and determining optical constant of materials
- Spectrum range of 245 to 1000 nm (470 wavelengths)
- 45° to 90° angle of incidence manual angular stage
- Stage mapping of thin film uniformity
- Multiple layer and surface roughness modeling
- Focusing lens attachment for measuring micron thin films
- Samples up to 300 mm in diameter and 20 mm in thickness
Location: 211 Engineering Research Building
Probe Microscopy
Atomic Force Microscope (AFM)
Nanoscope MultiMode AFM
- For obtaining 3D surface topography at sub-nanometer scale resolution
- Contact and friction force measurement between surfaces in contact
- Sample conductivity and magnetic property measurements in nano-scale region
- Maximum scan range of 125 μm × 125 μm
- Samples up to 15 mm diameter and 5 mm in thickness
Location: Engineering Sciences Building (ESB) - Room B64
Asylum MFP-3D AFM
- For obtaining 3D surface topography at sub-nanometer scale resolution
- Contact and friction force measurement between surfaces in contact
- Sample conductivity and magnetic property measurements in nano-scale region
Location: White Hall B-20A