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MCF Instruments

X-Ray Diffractometry Chemical Optical Probe Microscopy

X-Ray Diffractometry

PANalytical X’Pert Pro XRD 

Location: 211 Engineering Research Building

Bruker D8 Discovery XRD

  • For determining the crystal structure of solids, powders and thin films
  • Reciprocal space mapping of crystalline materials and 2D mapping of wafers
  • Cu-kα1 8047.2 eV source
  • Maximum X-Ray power of 50 kV and 50 mA and 1 mm slit size
  • 360° angular range with a maximum user range of -100° < 2θ < 169°
  • Leptos analysis software
  • 1 inch hot stage from ambient to 900 °C
  • 1 inch sample clip stage
  • 5 inch vacuum stage
  • Powders, thin films or bulk materials

Location: 211 Engineering Research Building


X-ray Photoelectron Spectroscopy/Ultraviolet Photoelectron Spectroscopy (XPS/UPS)

Physical Electronics PHI 5000 VersaProbe XPS/UPS

Location: B62 Engineering Sciences Building

Fourier Transform Infra-Red (FTIR) Spectrometer

Digilab FTS 7000 FTIR System 

Location: 211 Engineering Research Building

Raman Spectroscopy

Renishaw InVia Raman Microscope 

Location: 381D Chemistry Research Laboratory Building



J.A. Woollam M-2000U Ellipsometer 

Location: 211 Engineering Research Building

Probe Microscopy

Atomic Force Microscope (AFM)

Nanoscope MultiMode AFM 

Location: Engineering Sciences Building (ESB) - Room B64

Asylum MFP-3D AFM

Location: White Hall B-20A