Scanning Electron Microscopes (SEM)
JEOL JSM-7600F SEM
Purpose: Structural characterization and e-beam lithography of complex patterns at nanometer scale precision
- Accelerating voltage of 0.1 (Gentle beam mode) to 30 KV
- Magnification range from 25 to 1,000,000
- Large specimen chamber (up to 200mm diameter)
- EDAX TEAM EDS capabilities for elemental analyses and phase mapping
- Located inside a cleanroom environment, allowing a variety of processes to be developed
Transmission Electron Microscope (TEM)
JEOL JEM-2100 TEM
Purpose: Structural analysis of a wide range of specimens in diverse fields such as materials, nanotechnology, biological sciences among others.
Instrument Specifications:
- JEOL JEM-2100 LaB6 Transmission Electron Microscope
- High resolution and fast data collection
- Oxford EDS capability for elemental analyses
- Gatan OneView digital camera to align,search, focus, and stigmate at 4k x 4k resolution to image samples
Sample Preparation
Baltec CO2 Critical Point Dryer CPD30
Purpose: Sample preparation for SEM
Instrument Specifications:
- CO2 critical point dryer for SEM sample preparation, dehydrating samples by exchange of ethanol with liquid carbon dioxide. It features:
- Multiple holders for diverse sample types
- Full control of entire process by user
- Ideal for biological samples or MEMs devices
Leica Ultramicrotome UC7 RT
Purpose: Sample preparation for electron microscopy
Instrument Specifications:
- Easy preparation of sections for TEM, SEM, AFM and LM examination
- Automatic thin and ultrathin cuts with high reproducibility
- Ancillary equipment: glass knife maker
- Three independent LED light sources that provide outstanding illumination
- Easy operation for new or experienced users
Denton Desk V Sputter and Carbon Coater
Purpose: Sample preparation for electron microscopy
Instrument Specifications:
- Gold/Paladium target for SEM sample preparation
- Carbon evaporation system for TEM sample preparation
- Other targets can be used upon request/need
- Automatic running mode reduces need for user action
- Easy operation for new or experienced users
Allied High Tech MultiPrep Polishing System
Purpose: Grinding and polishing of samples for electron microscopy
Instrument Specifications:
- Semi-automatic polishing system
- Hands-free polishing of TEM/SEM samples
- Multiple holders to prepare TEM samples in parallel or cross-section orientations
- 8-in platen for diamond lapping films or others
- Variable speed rotation and oscillation
- Indicators showing the amount of material polished (in microns)
- Ancillary equipment: optical microscope Axio to verify polished surfaces
- Ancillary equipment: slow speed saw Allied High Tech to reduce large samples before polishing
Fischione 1050 TEM Mill
Purpose: Sample preparation for TEM
Instrument Specifications:
- Fully automated control
- Two independently adjustable ion sources
- High energy operation for rapid milling of sample for electron microscopy
- Simple setup of milling parameters
BioSample Preparation Lab
Purpose: Preparation of biological materials for scanning or transmission electron microscopy
Lab Specifications:
- Pre-fixing, fixing and pos-fixing standard protocols
- Embedding protocol using EPON 812, Spurrs and other methods
- Staining protocols