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Instrumentation List

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Instrument Mfr/Model Type Description Picture Facilities Contact Campus, Room Location Address
X-ray Diffractometer  Bruker D8 Discovery 
X-ray diffractometer for determining crystal structure of powders, pellets, thin films, or bulk materials; reciprocal space mapping of crystalline materials and 2D mapping of wafers; Cu-kα1 8047.2 eV source; 45 kV and 40 mA max. X-ray power; 0° < 2Ɵ < 110° angular range; spinning, universal, and clip-on sample stages; automatic sample loader for up to 45 samples; Highscore Plus analysis software with PDF 3 database Bruker D8 Discovery XRD Materials Characterization Qiang Wang, Ph.D., 304 293-9683 Evansdale, ERB 211 389 Evansdale Dr.
X-ray Diffractometer  PANalytical X’Pert Pro 
X-ray diffractometer for identifying single-phase materials and multi-phase mixtures for powders, thin films, and bulk materials; quantitative determination of amounts of different phases in multi-phase mixtures; Cu-kα1 8047.2 eV source; 50 kV and 50 mA max. X-ray power with 1 mm slit size; 360° angular range with 100° < 2Ɵ < 169° max. user range; 1-in. hot stage from ambient to 900°C; 1-in. sample clip stage; 5-in. vacuum stage PANalytical xrd Materials Characterization Qiang Wang, Ph.D., 304 293-9683 Evansdale, ESB B61D 395 Evansdale Dr.
X-ray Diffractometer  Rigaku RU-300 
X-ray diffractometer for identifying crystal structure of thin films or bulk materials; reciprocal space mapping of crystalline materials and 2D mapping of wafers; Cu-kα1 8041 eV source; 2 mm high angle slit size and 1 mm low angle slit size; 0° < 2Ɵ < 92° high angle range and 0° < 2Ɵ < 0.10° low angle range; 50 kV and 150 mA max. X-ray power for high angle and 50 kV and 240 mA for low angle; rotating anode; 2 cm x 2 cm sample stage Rigaku xrd Materials Characterization Qiang Wang, Ph.D., 304 293-9683 downtown, WH 402 135 Willey St.
X-Ray Photoelectron Spectroscope   Physical Electronics PHI 5000 VersaProbe 
X-ray photo electron spectroscope for determining micro-area element composition and chemical state at the surface of powders and thin films; depth profile analysis of structures and interfaces; Al, Mg, and focused Al X-ray sources and He UV source; spectral range of 0 to 1400 eV binding energy; 0.50 eV energy resolution; up to 50 mm diameter sample size Materials Characterization Qiang Wang, Ph.D., 304 293-9683 Evansdale, ESB B62 395 Evansdale Dr.
Raman Microscope Renishaw InVia 
Raman microscope for determining chemical composition, molecular structure, and molecular interactions and conducting quantitative analysis of material chemical compositions; < 1 µm lateral spatial resolution; 409 nm, 532 nm, and 785 nm excitation wavelengths at 100 mW max. power; max. sample size of 9 mm x 15 mm x 8 mm thick Ramans Materials Characterization Qiang Wang, Ph.D., 304 293-9683 downtown, WH B20B 135 Willey St.
 Fourier Transform Infra-Red (FTIR) Spectrometer Digilab FTS 7000/UMA 600
spectrometer-FTIR for analyzing chemical composition of micro/macro samples and qualitatively identifying molecules and functional groups; 25,000 to 50 cm-1 mid-IR-to-near-IR source spectrum wavenumbers; 10,000 to 150 cm -1 wavenumber detection range; variable angle, Ge ATR, diamond ATR, and photo-acoustic bench accessories; UA 600 infrared microscope with MCT and Stingray MCT array detectors DigiLab UMA 600 FTIR Materials Characterization Qiang Wang, Ph.D., 304 293-9683 Evansdale, ERB 211 389 Evansdale Dr.
Ellipsometer White Light  J.A. Woollam M-2000U 
ellipsometer for characterizing film thickness with Angstrom accuracy and determining optical constant of materials; 245 to 1,000 nm (470 wavelengths) spectrum range; 45° to 90° angle of incidence manual angular stage; stage mapping for thin film uniformity; multiple layer roughness modeling; focusing lens attachment for measuring micron thin films; samples up to 300 mm diameter and 20 mm thickness J.A. Woolam EC-400 White Ellipsometer Materials Characterization Qiang Wang, Ph.D., 304 293-9683 Evansdale, ERB 211 389 Evansdale Dr.
Atomic Force Microscope Nanoscope MultiMode Scanning Probe 
microscope-atomic force for obtaining 3D surface topography at sub-nanometer resolution; contact and friction force measurement between surfaces in contact; sample conductivity and magnetic property measurements in nano-scale region; 125 µm x 125 µm max. scan range; samples up to 15 mm diameter and 5 mm thickness Nanoscope AFM Materials Characterization Qiang Wang, Ph.D., 304 293-9683 downtown, WH B20B 135 Willey St.
 Atomic Force Microscope Asylum MFP-3D
microscope-atomic force for obtaining 3D surface topography at sub-nanometer resolution; contact and friction force measurement between surfaces in contact; sample conductivity and magnetic property measurements in nano-scale region; samples up to 80 mm diameter Asylum AFM Materials Characterization Qiang Wang, Ph.D., 304 293-9683 downtown, WH B20B 135 Willey St.
Spinning Disk Confocal Fluorescent Microscope Olympus 
microscope--confocal fluorescent DSU spinning disc confocal system; DAPI, FTIC, CY3, and U/B/G fluorescence filter cubes; CCD camera for high speed imaging and video recording; 4x, 20x, 40x, and 100x objectives; motorized stage for 3D confocal imaging Materials Characterization Qiang Wang, Ph.D., 304 293-9683 downtown, WH B20B 135 Willey St.
Optical Profiler Bruker Contour GT K0 
profiler-optical synchronous pulsed fluorescence illuminator; 5x, 10x, and 50x objectives with 2x field-of-view multiplier; 5x Through Transmissive Media objective; motorized staging for data stitching Cleanroom Qiang Wang, Ph.D., 304 293-9683 Evansdale, ESB G75B 395 Evansdale Dr.

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BioNano Manager:
Qi Zeng
, Ph.D. | (304) 293-0747
Materials Characterization Manager:
Qiang Wang , Ph.D. | (304) 293-9683
Electron Microscopy Manager:
Marcela Redigolo
, Ph.D. | (304) 293-9683
Cleanroom Manager:
Harley Hart
| (304) 293-5847