JEOL JEM-2100

• For microstructure observation of materials at high resolution and material crystal structure determination
• Micro-chemical analysis of the materials with Energy Dispersive X-ray (EDX) Spectrometer
• Accelerating Voltage between 80 and 200 kV
• Magnification of 50 to 1,500,000 x

Responsible Staff Member: Dr. Marcela Redigolo

 

Location: B63 ESB

Allied High Tech Mulitprep Precision Polishing System

• For  preparing a wide range of materials for microscopy studies, including parallel polishing, precise angle polishing, site-specific polishing, or any combination.
• Can execute second-side TEM wedge polishing, wedge/plan-view TEM polishing and multiple-sample thinning for FIB analyses.
• Quantification of material removal by maintaining geometric orientation of the sample relative to the abrasive plane during polishing and monitoring rate of polish.
• Platen rotation speeds range from 5 to 350 RPM, clockwise or counterclockwise.
• Cross-sectioning paddleholds for flat, unencapsulated samples perpendicular to the platen.

Responsible Staff Member: Dr. Marcela Redigolo

Location: B64 ESB

JEOL JSM-7600F

• For structure observation at nanometer scale resolution
• Accelerating voltage of 0.1 to 30 kV
• Magnification range from 25 to 1,000,000´
• NPGS Software for E-Beam Lithography
• Energy Dispersive X-ray (EDX) Spectrometer (Oxford INCA) for auantitative material chemical composition analysis and elemental X-ray mapping
• Enclosure for acoustical noise damping, active electromagnetic field canellation, vibration isolation and temperature stability
• Samples up to 4 inch diameter

Responsible Staff Membes: Marcela Redigolo and Kolin Brown

Location: G75 ESB Cleanroom

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CO₂ Critical Point Dryer - Tousimis Autosamdri 815

• For drying biological samples for SEM or releasing MEMS devices
• 1 ¼ inch diameter x 1 ¼ inch high chamber

Responsible Staff Member: Marcela Redigolo

Location: G75 ESB Cleanroom