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MCF User Resources

Crystallography

X-Ray Diffraction (XRD) – Bruker D8 Discovery

X-Ray Diffraction (XRD) – PANalytical X’Pert Pro

X-Ray Diffraction (XRD) – Rigaku RU-300

Optical Spectroscopy

Fourier Transform Infrared Spectroscopy (FTIR)

Raman Spectroscopy

Atomic Force Microscopy

Atomic Force Microscopy (AFM) – Asylum MFP-3D

Atomic Force Microscopy (AFM) – Nanoscope Multimode

Spectroscopic Ellipsometry

White Light Ellipsometer

Surface Chemical Analysis

X-Ray Photoelectron Spectroscopy (XPS)

Ultraviolet Photoelectron Spectroscopy (UPS)

Fluorescence Microscopy

Spinning Disk Confocal Fluorescence Microscope

Surface Metrology

Optical Profiler